4.1 Overview
4.2 Defining Global Mesh Settings
4.3 Defining Regional Refinements
4.4 Saving the Model
4.5 Meshing the Device Structure
4.6 Assignment
This section provides instructions on how to control the mesh generation process.
This process is performed in two steps. The first step defines the meshing strategy, which includes the maximum and minimum meshing step definition in each device dimension as well as the mesh refinement strategies. The second step links the defined strategy from the first step to a specific target, which is, in general, a material, or a device region, or a user-defined evaluation window.
Different device regions have different roles in terms of determining the device performance, thereby the required meshing strategies for these regions are typically different.
The first step always is the definition of mesh controls that are applied to the entire device structure.
For that, first you define the window, which covers the entire device domain:
Figure 1. Refinement window covering the entire device. (Click image for full-size view.)
Figure 2. Exact Coordinates dialog box.
The corresponding Scheme command is:
(sdedr:define-refeval-window "RefWin.all" "Rectangle" (position -1 -0.5 0) (position 1 1.5 0))
In the next step, you associate the global refinement window with the refinement box and select the mesh controls to be used globally:
Figure 3. Refinement Specification dialog box for global refinement definition. (Click image for full-size view.)
The corresponding Scheme commands are:
(sdedr:define-refinement-size "RefDef.all" 0.25 0.1 0.25 0.1) (sdedr:define-refinement-placement "PlaceRF.all" "RefDef.all" "RefWin.all") (sdedr:define-refinement-function "RefDef.all" "DopingConcentration" "MaxTransDiff" 1) (sdedr:define-refinement-function "RefDef.all" "MaxLenInt" "Silicon" "Oxide" 0.001 1.5 "DoubleSide")
In addition to the global mesh refinement, the meshing strategy can be restricted to areas of interest, such as specific regions or restricted device domains.
In the discussed example, additional refinement is applied to the epi region R.Siliconepi and to the selected domain confined within the transistor channel.
To define a refinement box confined within the epi region R.Siliconepi:
Figure 4. Refinement Specification dialog box for regionwise refinement specification. (Click image for full-size view.)
The corresponding Scheme commands are:
(sdedr:define-refinement-size "RefDef.Epi" 0.1 0.0125 0.0025 0.0025) (sdedr:define-refinement-function "RefDef.Epi" "DopingConcentration" "MaxTransDiff" 1) (sdedr:define-refinement-region "PlaceRF.Epi" "RefDef.Epi" "R.Siliconepi") (sdedr:define-refinement-function "RefDef.Epi" "MaxLenInt" "R.Siliconepi" "R.Gateox" 0.0002 1.5 "DoubleSide" "UseRegionNames")
The link between the refinement window and the refinement definitions can be directly set in the Refinement Specification dialog box. Here, you see how to refine the mesh in the middle of the transistor channel:
Figure 5. Refinement Specification dialog box for window-wise refinement specification. (Click image for full-size view.)
You should see the refinement box highlighted in green after it is created.
Figure 6. Window-based channel refinement box highlighted. (Click image for full-size view.)
The corresponding Scheme commands are:
(sdedr:define-refeval-window "RefWin.channel" "Rectangle" (position -0.1 0.0 0.0) (position 0.1 0.1 0.0)) (sdedr:define-refinement-size "RefDef.channel" 0.25 0.1 0.025 0.01) (sdedr:define-refinement-placement "PlaceRF.channel" "RefDef.channel" "RefWin.channel")
To save the model with the name soifet, follow the instructions in Section 2.12 Saving the Model.
The saved files are soifet.sat, soifet.scm, soifet_msh.cmd, and soifet_bnd.tdr.
Click to view all the commands discussed in this section in the command file soifet_dvs.cmd.
To this point, several meshing strategies have been defined and placed in various device regions (windows). Now, you need to create the mesh in the device.
To build a mesh:
Figure 7. Build Mesh dialog box.
The corresponding Scheme command for launching the meshing operation is:
(sde:build-mesh "soifet")
This command saves two files used by Sentaurus Mesh, namely, the mesh command file soifet_msh.cmd and the TDR boundary representation soifet_bnd.tdr of the device. In the project, the n@node@ name is used instead of the soifet name.
Click to view the mesh command file soifet_msh.cmd.
Figure 8 shows the device structure with its current meshing and doping conditions, viewed using Sentaurus Visual.
Figure 8. Two-dimensional SOI MOSFET meshed with above-described mesh controls.(Click image for full-size view.)
Figure 9 shows a detailed view of the mesh near the drain/channel junction region.
Figure 9. Mesh near the drain/channel junction region. (Click image for full-size view.)
Click to view all the commands discussed in this section in the command file soifet_dvs.cmd.
The complete project can be investigated from within Sentaurus Workbench in the directory Applications_Library/GettingStarted/sde/soifet.
Define a meshing strategy for the SiGe HBT from Section 3.5 Assignment.
Figure 10. Two-dimensional SiGe HBT with its current meshing and doping conditions.
Click to view a solution of the command file sigehbt_dvs.cmd.
The complete project can be investigated from within Sentaurus Workbench in the directory Applications_Library/GettingStarted/sde/sigehbt.
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